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J. Schneider

The benefits of interferometry for the characterization of extrasolar planetary systems
Technology roadmap for future interferometric facilities, Proceedings of the European Interferometry Initiative Workshop organized in the context of the 2005 Join European and National Astronomy Meeting "Distant Worlds", 6 - 8 July 2005, Liège University, Institute of Astrophysics, Edited by J. Surdej, D. Caro, and A. Detal

(Volume 74 - Année 2005 — Numéros 1-2- 3)
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Abstract

Interferometry is a useful tool to separate planets from their parent star.  In addition to make a direct detection (by a snapshot image or by visibility measurements), it can be used to provide an indirect characterization the planetary systems (their architecture, star-planet interaction etc) in different ways such as astrometry and stellar surface imaging.  A comprehensive prospective review of all these approaches is given.

Pour citer cet article

J. Schneider, «The benefits of interferometry for the characterization of extrasolar planetary systems», Bulletin de la Société Royale des Sciences de Liège [En ligne], Volume 74 - Année 2005, Numéros 1-2- 3, 57-71 URL : https://popups.uliege.be/0037-9565/index.php?id=323.

A propos de : J. Schneider

Observatoire de Paris - F92195 Meudon, France