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- volume 14 (2011)
- number 1-2
- Short note: Synthetic ilmenite as a blank to XRF trace element determination
ya que 05 febrero 2011 :
Vista(s): 697 (13 ULiège)
Descargar(s): 397 (11 ULiège)
Vista(s): 697 (13 ULiège)
Descargar(s): 397 (11 ULiège)
Jean Clair DUCHESNE & Guy BOLOGNE
Short note: Synthetic ilmenite as a blank to XRF trace element determination
(volume 14 (2011) — number 1-2)
Article
Mots-clés : ilmenite, XRF trace element analysis, Vanadium, Chromium, evacuated silica-glass tube
Abstract
This note describes a convenient method to synthesize a blank ilmenite through the evacuated silica-glass tube technique. The lower limit of detection of the V and Cr determinations are 21 ppm and 9 ppm, respectively.
Para citar este artículo
Jean Clair DUCHESNE & Guy BOLOGNE, «Short note: Synthetic ilmenite as a blank to XRF trace element determination», Geologica Belgica [En ligne], volume 14 (2011), number 1-2, 103-106 URL : https://popups.uliege.be/1374-8505/index.php?id=3230.
Acerca de: Jean Clair DUCHESNE
Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium
Acerca de: Guy BOLOGNE
Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium