Geologica Belgica

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sinds 05 februari 2011 :
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Jean Clair DUCHESNE & Guy BOLOGNE

Short note: Synthetic ilmenite as a blank to XRF trace element determination

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Mots-clés : ilmenite, XRF trace element analysis, Vanadium, Chromium, evacuated silica-glass tube

Abstract

This note describes a convenient method to synthesize a blank ilmenite through the evacuated silica-glass tube technique. The lower limit of detection of the V and Cr determinations are 21 ppm and 9 ppm, respectively.

Om dit artikel te citeren:

Jean Clair DUCHESNE & Guy BOLOGNE, «Short note: Synthetic ilmenite as a blank to XRF trace element determination», Geologica Belgica [En ligne], volume 14 (2011), number 1-2, 103-106 URL : https://popups.uliege.be/1374-8505/index.php?id=3230.

Over : Jean Clair DUCHESNE

Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium

Over : Guy BOLOGNE

Department of Geology, University of Liège, B20, 4000 Sart Tilman, Belgium