Optimization of the interference layer metallography for automatic image analysis and its application to high temperature alloys
Knuth Schmidt,
Institute of Reactor Materials, Nuclear Research Centre Jülich, P.O. Box 1913, 5170 Jülich, F.R.G.
Helmut Hoven,
Institute of Reactor Materials, Nuclear Research Centre Jülich, P.O. Box 1913, 5170 Jülich, F.R.G.
Karl Koizlik,
Institute of Reactor Materials, Nuclear Research Centre Jülich, P.O. Box 1913, 5170 Jülich, F.R.G.
Jochen Linke,
Institute of Reactor Materials, Nuclear Research Centre Jülich, P.O. Box 1913, 5170 Jülich, F.R.G.
Abstract
Conventional metallographic procedures usually yield sufficient contrast just to distinguish precipitates from the metallic matrix. However, to discriminate for example between different types of carbides these procedures do not always supply satisfactory results - especially if microstructural analyses by automatic analyzers are required. To increase the contrast, interference layers are deposited on the polished section. In order to optimize this procedure criteria for the selection of suitable interference layer materials and specifications for the layer-thickness and wavelength of the direct illumination have been determined.
Pour citer cet article
Knuth Schmidt, Helmut Hoven, Karl Koizlik & Jochen Linke, «Optimization of the interference layer metallography for automatic image analysis and its application to high temperature alloys», Acta Stereologica [En ligne], Volume 3 (1984), Number 2 - Dec. 1984, 175-180 URL : https://popups.uliege.be/0351-580x/index.php?id=4010.