Multi-Beam Scanning Electron Microscopy (MBSEM) at 0.5 TB/s ?
Shammi Rahangdale,
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands ; s.l.rahangdale@tudelft.nl
Yan Ren,
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands
C.W. Hagen,
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands
P. Kruit,
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands
Pour citer cet article
Shammi Rahangdale, Yan Ren, C.W. Hagen & P. Kruit, «Multi-Beam Scanning Electron Microscopy (MBSEM) at 0.5 TB/s ?», Acta Stereologica [En ligne], Proceedings ICSIA, 14th ICSIA abstracts, URL : https://popups.uliege.be/0351-580x/index.php?id=3802.