maximum likelihood
- Jaap Van Pelt & Ronald W.H. Verwer
- Growth models for topological binary branching patterns
- Volume 4 (1985)Number 2 - Proceedings of the fourth European symposium for stereology - Dec. 1985
- Marco Longfils, Erich Schuster, Aila Särkkä, Niklas Lorén & Mats Rudemo
- Single particle raster image diffusion analysis
- Proceedings ICSIA14th ICSIA abstracts
>> Index by keyword