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Shammi Rahangdale, Yan Ren, C.W. Hagen & P. Kruit
Multi-Beam Scanning Electron Microscopy (MBSEM) at 0.5 TB/s ?
(Proceedings ICSIA — 14th ICSIA abstracts)
Article
![Open Access](images/Open_Access.png)
Keywords : 2D and 3D image acquisition, MatLab and LabView, microscopic imaging and analysis
Pour citer cet article
Shammi Rahangdale, Yan Ren, C.W. Hagen & P. Kruit, «Multi-Beam Scanning Electron Microscopy (MBSEM) at 0.5 TB/s ?», Acta Stereologica [En ligne], Proceedings ICSIA, 14th ICSIA abstracts, URL : https://popups.uliege.be/0351-580x/index.php?id=3802.
A propos de : Shammi Rahangdale
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands ; s.l.rahangdale@tudelft.nl
A propos de : Yan Ren
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands
A propos de : C.W. Hagen
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands
A propos de : P. Kruit
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands