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- Mathematical background to stereology and morphometry for diagnostic pathologists
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Yrjö Collan, Erkki Oja & William F. Whimster
Mathematical background to stereology and morphometry for diagnostic pathologists
(Volume 2 (1983) — Number 2 - Proceedings of the second symposium on morphometry in morphological diagnoses, september 7-9, 1983, Kuopio, Finland - Dec. 1983)
Article
Abstract
A short introduction to the basic mathematical principles which govern stereology and morphometry is given. The selection of principles introduced was chosen to cover the needs of a pathologist active in diagnostic histopathology. For one to get an overall picture of the fields of morphometry and stereology also and acquaintance with statistics of sampling and potential computer applications is necessary.
Pour citer cet article
Yrjö Collan, Erkki Oja & William F. Whimster, «Mathematical background to stereology and morphometry for diagnostic pathologists», Acta Stereologica [En ligne], Volume 2 (1983), Number 2 - Proceedings of the second symposium on morphometry in morphological diagnoses, september 7-9, 1983, Kuopio, Finland - Dec. 1983, 214-238 URL : https://popups.uliege.be/0351-580x/index.php?id=4182.
A propos de : Yrjö Collan
Department of Pathology, University of Kuopio, SF-70101 Kuopio, Finland
A propos de : Erkki Oja
Department of Applied Mathematics, University of Kuopio, SF-70101 Kuopio, Finland
A propos de : William F. Whimster
King's College Hospital Medical School, London, Great Britain