Atomic positions from high resolution transmission electron microscopy images of grain boundaries

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Abstract

High resolution transmission electron microscopy images are constituted by diffuse spots which correspond to atomic columns of the observed crystal. In the case of grain boundaries including defects, the atomic positions accounting for the elastic distorsions of the crystals can be calculated. In order to compare calculated and experimental positions, it is necessary to extract the "centers" of the spots from experimental images. A simple method is proposed here, involving two steps: first, the identification of spot Zones, with individual masks, then calculation of intensity weighed center of each spot inside each mask. The method was tested on a simple image and applied on a Ni₃Al-Ni₃Nb grain boundary, showing satisfactory agreement between predicted and experimental atomic positions.

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Acerca de: Jean-Marc Chaix